logo

Standards Manage Your Business

We Manage Your Standards

    Log in / Signup cart wishlist
    IEEE

    IEEE 1851:2023

    IEEE Standard for Design Criteria of Integrated Sensor-Based Test Applications for Household Appliances

    Standard Details

    Committee/Society: IEEE Consumer Technology Society/Emerging Technology StandardDetails Committee

    Abstract: A data integrated framework of the test software for household appliances is defined by this standard. The node information of complex virtual instruments (CVIs), the sensor parameter information, the test metadata information, and the sensor data information, as well as the means to acquire the information (either microservices or data-exchange files), are specified by this standard.

    Keywords: complex virtual instruments, household appliances test, IEEE 1851™, microservice, sensor data, systems interoperability

    Multimedia: N

    Subscription Package: Testing, Instrumentation and Measurement, and Metric Practice

    IEEE Normative references: 2735-2022

    Life Cycle: Revision of IEEE 1851-2012

    Publication Type: IEEE Standard

    Publication Date: 2023-07-14

    Page Count: 40

    General Information

    Status : ACTIVE
    Standard Type: Main
    Document No: IEEE 1851:2023
    Document Year: 2023
    Pages: 40
    • ICS:
    • 35.240.50 IT applications in industry
    • 97.180 Miscellaneous domestic and commercial equipment
    Preview Document

    Life Cycle

    Currently Viewing

    ACTIVE
    IEEE 1851:2023

    Related Standards

    Standard
    24
    Apr
    IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data...
    ...
    IEEE 1450 : 2023
    Standard
    18
    Sep
    IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Tes...
    ...
    IEEE 1450.4:2017
    Standard
    13
    Jun
    IEEE Standard for Memory Modeling in Core Test Language...
    ...
    IEEE 1450.6.2:2014
    Standard
    15
    May
    Information technology -- Smart transducer interface for sensors and actuators -- Common functions, ...
    ...
    IEEE 21450:2010
    Standard
    13
    Jul
    IEEE Standard for Describing On-Chip Scan Compression...
    ...
    IEEE 1450.6.1:2009
    Standard
    07
    Jul
    IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Te...
    ...
    IEEE 1450.3:2007
    Standard
    05
    Jan
    IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)...
    ...
    IEEE 1450.6:2005
    Standard
    30
    Sep
    IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Sem...
    ...
    IEEE 1450.1:2005
    Knowledge Corner

    Expand Your Knowledge and Unlock Your Learning Potential - Your One-Stop Source for Information!

    © Copyright 2024 BSB Edge Private Limited.

    Enquire now +
    This Website Uses Cookies to Manage Services