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IEEE 1687:2014

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

Standard Details

This standard develops a methodology for access to embedded instrumentation, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and additional signals that may be required. The elements of the met

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE 1687:2014
Document Year: 2014
Pages: 266

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IEEE 1687:2014
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