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IEEE Standard for a Mixed-Signal Test Bus
Abstract: The testability structure for digital circuits described in IEEE Std 1149.1™ has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard Boundary-Scan Description Language (BSDL) are defined that allow description of key component-specific aspects of such testability features.
Keywords: analog test, board testing, boundary scan, Boundary-Scan Description Language (BSDL), design for testability, IEEE 1149.4™, in-circuit test, mixed-signal test
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