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IEEE/IEC 62528:2007

IEC 62528 Ed. 1 (IEEE Std 1500™-2005): Standard Testability Method for Embedded Core-based Integrated Circuits

Standard Details

New IEEE Standard - Superseded. Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facil

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE/IEC 62528:2007
Document Year: 2007

Life Cycle

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IEEE/IEC 62528:2007
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