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IEEE/IEC 62526:2007

IEC 62526 Ed. 1 (IEEE Std 1450.1™-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Standard Details

New IEEE Standard - Active. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE/IEC 62526:2007
Document Year: 2007
Pages: 128

Life Cycle

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IEEE/IEC 62526:2007
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