logo

Standards Manage Your Business

We Manage Your Standards

IEC

IEC TS 61586:2017 (EN-FR)

Estimation of the reliability of electrical connectors

Standard Details

IEC TS 61586:2017 deals with the estimation of the inherent design reliability of electrical connectors through the definition and development of an appropriate accelerated testing programme. The basic intrinsic degradation mechanisms of connectors, which are those mechanisms which exist as a result of the materials and geometries chosen for the connector design, are reviewed to provide a context for the development of the desired test programme. While extrinsic degradation mechanisms may also significantly affect the performance of connectors, they vary widely by application and thus are not addressed in this document. This second edition cancels and replaces the first edition published in 1997. This edition constitutes a technical revision. The main technical changes with regard to the previous edition are as follows: A specific “basic” testing protocol is defined which utilizes a single test group subjecting connectors to multiple stresses, Additional information is provided concerning test acceleration factors, A discussion of the limitations of providing MTTF/MTBF estimates for connectors has been added and the bibliography has been expanded.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC TS 61586:2017 (EN-FR)
Document Year: 2017
Pages: 55
Edition: 2.0
  • Section Volume:
  • TC 48 Electrical connectors and mechanical structures for electrical and electronic equipment
  • ICS:
  • 31.220.10 Plug-and-socket devices. Connectors

Life Cycle

Currently Viewing

ACTIVE
IEC TS 61586:2017 (EN-FR)
Knowledge Corner

Expand Your Knowledge and Unlock Your Learning Potential - Your One-Stop Source for Information!

© Copyright 2024 BSB Edge Private Limited.

Enquire now +