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IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV (EN-FR)

Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test

Standard Details

Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. This standard defines
- test voltage waveform;
- range of test levels;
- test generator;
- test set-up;
- test procedure.
This consolidated version consists of the first edition (1999), its amendment 1 (2001) and its amendment 2 (2008). Therefore, no need to order amendments in addition to this publication.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV (EN-FR)
Document Year: 2008
Pages: 29
Edition: 1.2

Life Cycle

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IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV (EN-FR)
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