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ISO 24688:2022

Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods

Standard Details

This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).

General Information

Status : Published
Standard Type: Main
Document No: ISO 24688:2022
Document Year: 2022
Pages: 8
Edition: 1
  • ICS:
  • 25.220.01 Surface treatment and coating in general

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ISO 24688:2022
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