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20/30406234 DC

BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2. Test method for bipolar degradation by body diode operating

General Information

Status : Definitive
Standard Type: Main
Document No: 20/30406234 DC
Document Year:
Pages: 11
  • Section Volume:
  • GBM21 Electronic Components & Devices (GMB21)

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20/30406234 DC
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