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17/30366375 DC

BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) - Part 1. Fast BTI Test method

General Information

Status : Definitive
Standard Type: Main
Document No: 17/30366375 DC
Document Year:
Pages: 16
  • Section Volume:
  • GBM21 Electronic Components & Devices (GMB21)

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17/30366375 DC
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