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IEC 62373:2006 (EN-FR)

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Standard Details

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62373:2006 (EN-FR)
Document Year: 2006
Pages: 27
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices

Life Cycle

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ACTIVE
IEC 62373:2006 (EN-FR)
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