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IEC 60749-27:2006/AMD1:2012 (EN-FR)

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

General Information

Status : ACTIVE
Standard Type: Amendment
Document No: IEC 60749-27:2006/AMD1:2012 (EN-FR)
Document Year: 2012
Pages: 5
Edition: 2.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
IEC 60749-27:2006/AMD1:2012 (EN-FR)
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