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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

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    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    IEC 62276:2025 forword
    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    • $ 345.13 | PDF |
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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
    IEC TS 61994-5 : 2023 forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
    • $ 49.30 | PDF |
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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
    IEC TS 61994-5 : 2023 RLV forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
    • $ 83.82 | PDF |
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    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    IEC 61837-2:2018 (EN-FR) forword
    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    • $ 474.55 | PDF |
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    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    IEC 61837-2:2018 forword
    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    • $ 474.55 | PDF |
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    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
    IEC 61837-3:2015 (EN-FR) forword
    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
    • $ 141.75 | PDF |
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    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
    IEC 61837-4:2015 (EN-FR) forword
    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
    • $ 98.61 | PDF |
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    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    IEC 62884-1:2017 forword
    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    • $ 449.90 | PDF |
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    Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
    IEC 61338-1-4:2005 (EN-FR) forword
    Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
    • $ 308.15 | PDF |
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    Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
    IEC 61338-1-3:1999 (EN-FR) forword
    Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
    • $ 191.05 | PDF |
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    Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
    IEC 61338-1-4:2005 forword
    Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
    • $ 308.15 | PDF |
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    Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
    IEC 61338-1-5:2015 (EN-FR) forword
    Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
    • $ 141.75 | PDF |
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    Filters using waveguide type dielectric resonators - Part 2: Guidance for use
    IEC 61337-2:2004 (EN-FR) forword
    Filters using waveguide type dielectric resonators - Part 2: Guidance for use
    • $ 246.52 | PDF |
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    Piezoelectric sensors - Part 1: Generic specifications
    IEC 63041-1:2021 (EN-FR) forword
    Piezoelectric sensors - Part 1: Generic specifications
    • $ 246.52 | PDF |
    • $ 246.52 | PRINT |
    Piezoelectric sensors - Part 3: Physical sensors
    IEC 63041-3:2020 (EN-FR) forword
    Piezoelectric sensors - Part 3: Physical sensors
    • $ 98.61 | PDF |
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    Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    IEC 63041-2:2017 (EN-FR) forword
    Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    • $ 98.61 | PDF |
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    Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    IEC 63041-2:2017 forword
    Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    • $ 98.61 | PDF |
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    Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
    IEC 60642:1979/AMD1:1992 (EN-FR) forword
    Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
    • $ 12.33 | PDF |
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    Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
    IEC 60642:1979 (EN-FR) forword
    Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
    • $ 191.05 | PDF |
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    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
    IEC 62761:2014 (EN-FR) forword
    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
    • $ 191.05 | PDF |
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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
    IEC TS 61994-4-1:2018 RLV forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
    • $ 83.82 | PDF |
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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
    IEC TS 61994-4-4:2018 forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
    • $ 98.61 | PDF |
    • $ 98.61 | PRINT |
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters
    IEC TS 61994-2:2011 (EN-FR) forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters
    • $ 141.75 | PDF |
    • $ 141.75 | PRINT |
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
    IEC TS 61994-4-4:2018 RLV forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
    • $ 167.63 | PDF |
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    Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
    IEC TS 61994-1:2007 forword
    Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
    • $ 191.05 | PDF |
    • $ 191.05 | PRINT |
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