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IEEE 2665 : 2022
IEEE Recommended Practice for Statistical Process Control for EMC Test Laboratories

IEEE Recommended Practice for Statistical Process Control for EMC Test Laboratories

Document No. IEEE 2665 Document Year 2022
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This document is published by Institute of Electrical and Electronics Engineers (IEEE)

Standard Details

Abstract: Guidance is provided on how to verify electromagnetic compatibility (EMC) test performance through the use of statistical process control (SPC) and examples of setups. Employing SPC, the validity of tests can be monitored by a laboratory by recording data in such a way that trends are detectable, and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence, to both the laboratory and its customer, that test results will be correct.

Keywords: control limits, detection rules, electromagnetic compatibility, EMC, IEEE 2665, individual moving range, quality check, SPC, statistical process control, Walter Shewhart, XmR chart

Multimedia: N

Subscription Package: Electromagnetic Compatibility,Standards Review for National Bodies

Non-IEEE Normative references: IEC 61000-4-2, Electromagnetic compatibility (EMC)--Part 4-2: Testing and measurement techniques--Electrostatic discharge immunity test.

IEC 61000-4-4, Electromagnetic compatibility (EMC)--Part 4-4: Testing and measurement techniques –Electrical fast transient/burst immunity test.

IEC 61000-4-5, Electromagnetic compatibility (EMC)--Part 4-5: Testing and measurement techniques--Surge immunity test.

Committee/Society: IEEE Electromagnetic Compatibility Society/Standards Development Committee

Life Cycle: New

Publication Type: IEEE Standard

Publication Date: 2023-01-27

Page Count: 42

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