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IEEE Recommended Practice for Statistical Process Control for EMC Test Laboratories
Abstract: Guidance is provided on how to verify electromagnetic compatibility (EMC) test performance through the use of statistical process control (SPC) and examples of setups. Employing SPC, the validity of tests can be monitored by a laboratory by recording data in such a way that trends are detectable, and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence, to both the laboratory and its customer, that test results will be correct.
Keywords: control limits, detection rules, electromagnetic compatibility, EMC, IEEE 2665, individual moving range, quality check, SPC, statistical process control, Walter Shewhart, XmR chart
Multimedia: N
Subscription Package: Electromagnetic Compatibility,StandardDetails Review for National Bodies
Non-IEEE Normative references: IEC 61000-4-2, Electromagnetic compatibility (EMC)--Part 4-2: Testing and measurement techniques--Electrostatic discharge immunity test.
IEC 61000-4-4, Electromagnetic compatibility (EMC)--Part 4-4: Testing and measurement techniques –Electrical fast transient/burst immunity test.
IEC 61000-4-5, Electromagnetic compatibility (EMC)--Part 4-5: Testing and measurement techniques--Surge immunity test.
Committee/Society: IEEE Electromagnetic Compatibility Society/StandardDetails Development Committee
Life Cycle: New
Publication Type: IEEE Standard
Publication Date: 2023-01-27
Page Count: 42
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