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    Piezoelectric devices

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    Synthetic quartz crystal - Specifications and guidelines for use
    IEC 60758:2016 forword
    Synthetic quartz crystal - Specifications and guidelines for use

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    Piezoelectric sensors - Part 1: Generic specifications
    IEC 63041-1:2021 RLV forword
    Piezoelectric sensors - Part 1: Generic specifications

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    Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    IEC 60679-1:2017 (EN-FR) forword
    Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

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    Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    IEC 60679-1:2017 forword
    Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

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    Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
    IEC 60679-5:1998 (EN-FR) forword
    Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

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    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    IEC 60689:2008 (EN-FR) forword
    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

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    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    IEC 60689:2008 forword
    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

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    Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval
    IEC 60679-5-1:1998 (EN-FR) forword
    Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

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    Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
    IEC 60679-4-1:1998 (EN-FR) forword
    Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval

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    Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
    IEC 60679-4:1997 (EN-FR) forword
    Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval

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    Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
    IEC 60444-9:2007 forword
    Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

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    Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
    IEC 60444-1:1986 (EN-FR) forword
    Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

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    Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
    IEC 60444-7:2004 (EN-FR) forword
    Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

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    Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
    IEC 60444-1:1986/AMD1:1999 (EN-FR) forword
    Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

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    Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
    IEC 60444-7:2004 forword
    Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

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    Characteristics and measurements of ultrasonic piezoceramic transducers
    IEC TR 61088:1991 (EN-FR) forword
    Characteristics and measurements of ultrasonic piezoceramic transducers

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    Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
    IEC 60368-4:2000 (EN-FR) forword
    Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval

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    Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
    IEC 60368-3:2010 (EN-FR) forword
    Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

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    Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
    IEC 60368-4-1:2000 (EN-FR) forword
    Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval

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    Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
    IEC 60368-2-2:1996 (EN-FR) forword
    Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters

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    Amendment 4 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    IEC 60050-561:2014/AMD4:2021 (EN-FR) forword
    Amendment 4 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

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    Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    IEC 60050-561:2014/AMD2:2020 (EN-FR) forword
    Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

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    Amendment 3 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    IEC 60050-561:2014/AMD3:2021 (EN-FR) forword
    Amendment 3 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

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    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
    IEC 62604-2:2022 RLV forword
    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

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    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    IEC 62604-1:2022 RLV forword
    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

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    • $ 457.37 481.44 | PDF |
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