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    Piezoelectric devices

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    Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
    IEC 63155:2020 (EN-FR) forword
    Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications

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    Piezoelectric ceramic resonators - Part 3: Standard outlines
    IEC 60642-3:1992 (EN-FR) forword
    Piezoelectric ceramic resonators - Part 3: Standard outlines

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    Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units
    IEC 60642-2:1994 (EN-FR) forword
    Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units

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    Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
    IEC 61019-3:1991 (EN-FR) forword
    Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

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    Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
    IEC 61019-2:2005 (EN-FR) forword
    Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

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    Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
    IEC 61019-2:2005 forword
    Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

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    Surface acoustic wave (SAW) resonators - Part 1: Generic specification
    IEC 61019-1:2004 (EN-FR) forword
    Surface acoustic wave (SAW) resonators - Part 1: Generic specification

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    Surface acoustic wave (SAW) resonators - Part 1: Generic specification
    IEC 61019-1:2004 forword
    Surface acoustic wave (SAW) resonators - Part 1: Generic specification

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    Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
    IEC 61261-2:1994 (EN-FR) forword
    Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

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    Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
    IEC 61261-2-1:1994 (EN-FR) forword
    Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

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    Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
    IEC 61178-2:1993 (EN-FR) forword
    Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval

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    Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification
    IEC 61178-2-1:1993 (EN-FR) forword
    Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification

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    Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
    IEC 62047-33:2019 forword
    Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device

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    Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
    IEC 62047-36:2019 forword
    Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films

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    Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
    IEC 62047-34:2019 forword
    Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer

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    Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
    IEC 60444-5:1995 (EN-FR) forword
    Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

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    Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
    IEC TR 60444-4:1988 (EN-FR) forword
    Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

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    Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    IEC 60444-6:2021 RLV forword
    Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

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    Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    IEC 60444-6:2021 (EN-FR) forword
    Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

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    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    IEC 60444-8:2016 (EN-FR) forword
    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

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    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    IEC 60444-8:2016 forword
    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

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    Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
    IEC 60444-2:1980 (EN-FR) forword
    Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

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    Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
    IEC 60444-9:2007 (EN-FR) forword
    Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

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    Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction
    IEC 60444-11:2010 (EN-FR) forword
    Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction

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    Piezoelectric filters of assessed quality - Part 1: Genericspecification
    IEC 60368-1:2000+AMD1:2004 CSV (EN-FR) forword
    Piezoelectric filters of assessed quality - Part 1: Genericspecification

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