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    Piezoelectric devices

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    Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    IEC 63041-2:2017 (EN-FR) forword
    Piezoelectric sensors - Part 2: Chemical and biochemical sensors

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    Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    IEC 63041-2:2017 forword
    Piezoelectric sensors - Part 2: Chemical and biochemical sensors

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    Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
    IEC 60642:1979/AMD1:1992 (EN-FR) forword
    Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

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    Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
    IEC 60642:1979 (EN-FR) forword
    Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

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    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
    IEC 62761:2014 (EN-FR) forword
    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
    IEC TS 61994-4-1:2018 RLV forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
    IEC TS 61994-4-4:2018 forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices

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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters
    IEC TS 61994-2:2011 (EN-FR) forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters

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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
    IEC TS 61994-4-4:2018 RLV forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices

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    Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
    IEC TS 61994-1:2007 forword
    Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
    IEC TS 61994-4-1:2018 forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

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    Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    IEC 60050-561:2014/AMD1:2016 (EN-FR) forword
    Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

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    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
    IEC 61837-1:2012 (EN-FR) forword
    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

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    Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    IEC 61837-2:2018/AMD1:2020 (EN-FR) forword
    Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    IEC 61837-2:2018+AMD1:2020 CSV (EN-FR) forword
    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    IEC 61837-2:2018+AMD1:2020 CSV forword
    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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    Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    IEC 61837-2:2018/AMD1:2020 forword
    Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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    Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices
    IEC TS 61994-4-3:2008 forword
    Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators
    IEC TS 61994-3:2021 forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators

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    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
    IEC TS 61994-4-2:2011 (EN-FR) forword
    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

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    Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
    IEC 62047-37:2020 (EN-FR) forword
    Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application

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    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
    IEC 62575-2:2012 (EN-FR) forword
    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use

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    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
    IEC 62575-1:2015 (EN-FR) forword
    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification

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    • $ 268.54 282.68 | PDF |
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    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    IEC 61240:2016 (EN-FR) forword
    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

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    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    IEC 61240:2016 forword
    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

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    • $ 123.53 130.03 | PDF |
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