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    Integrated circuits. Microelectronics

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    Integrated circuits - Three dimensional integrated circuits - Part 3: Model and measurement conditions of through-silicon via
    IEC 63011-3:2018 (EN-FR) forword
    Integrated circuits - Three dimensional integrated circuits - Part 3: Model and measurement conditions of through-silicon via

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    Integrated circuits - Part 1: Procedures for manufacturing line approval and quality management
    IEC 61739:1996 (EN-FR) forword
    Integrated circuits - Part 1: Procedures for manufacturing line approval and quality management

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    Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    IEC 62132-1:2015 (EN-FR) forword
    Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

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    Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
    IEC TS 62132-9:2014 (EN-FR) forword
    Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method

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    Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
    IEC 62132-8:2012 (EN-FR) forword
    Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

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    Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
    IEC 62132-4:2006 (EN-FR) forword
    Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

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    Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
    IEC 62228-6:2022 (EN-FR) forword
    Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers

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    Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
    IEC 62228-5:2021 (EN-FR) forword
    Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers

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    Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
    IEC 62228-5:2021 forword
    Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers

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    Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
    IEC 62228-7:2022 (EN-FR) forword
    Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers

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    Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
    IEC 62228-1:2018 (EN-FR) forword
    Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions

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    Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
    IEC 62228-1:2018 forword
    Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions

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    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
    IEC TR 61967-4-1:2005 forword
    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4

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    Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
    IEC 61967-8:2023 RLV forword
    Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

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    Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
    IEC TS 61967-3:2014 (EN-FR) forword
    Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method

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    Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
    IEC 61967-8:2023 (EN-FR) forword
    Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

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    Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
    IEC 61967-4:2021 RLV forword
    Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method

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    EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
    IEC 62433-3:2017 (EN-FR) forword
    EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

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    EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)
    IEC 62433-6:2020 (EN-FR) forword
    EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)

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    EMC IC modelling - Part 1: General modelling framework
    IEC 62433-1:2019 (EN-FR) forword
    EMC IC modelling - Part 1: General modelling framework

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    EMC IC modelling - Part 1: General modelling framework
    IEC 62433-1:2019 forword
    EMC IC modelling - Part 1: General modelling framework

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    EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
    IEC 62433-4:2016 (EN-FR) forword
    EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)

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    EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission
    IEC TR 62433-2-1:2010 (EN-FR) forword
    EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission

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    EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    IEC 62433-2:2017 (EN-FR) forword
    EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

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    Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
    IEC 62228-3:2019 (EN-FR) forword
    Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers

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    • $ 393.35 414.06 | PDF |
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