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ELECTRONICS

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BS EN 60384-22-1:2004

Fixed capacitors for use in electronic equipment - Blank detail specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2. Assessment level EZ

BS EN 60749-2:2002

Semiconductor devices. Mechanical and climatic test methods - Low air pressure

DD IEC/PAS 61076-2-110:2010

Connectors for electronic equipment. Product requirements - Circular connectors. Detail specification for circular connectors M 12 x 1 with screw-locking, for high speed Ethernet and high speed data communication with frequencies up to 500 MHz and 10 gigabits/s

BS EN 60603-6:1998

Connectors for frequencies below 3 MHz for use with printed boards - Edge-socket connectors and printed board connectors with 2,54 mm (0,1 in) contact spacing for single or double-sided printed boards of 1,6 mm (0,063 in) nominal thickness

BS EN 62258-5:2006

Semiconductor die products - Requirements for information concerning electrical simulation

BS EN 140402:2015+A1:2016

Blank Detail Specification: Fixed low power wirewound surface mount (SMD) resistors

PD IEC/TS 62715-5-2:2016

Flexible display devices - Measuring methods of optical characteristics from the vantage point for curved displays

BS EN 60393-6:2016

Potentiometers for use in electronic equipment - Sectional specification. Surface mount preset potentiometers

BS EN 61249-2-18:2002

Materials for interconnection structures. Sectional specification set for reinforced base materials, clad and unclad - Polyester non-woven fibreglass reinforced laminated sheet of defined flammability (vertical burning test), copper clad

Variable capacitors - Methods of test

BS EN 60512-14-4:2006

Connectors for electronic equipment. Tests and measurements - Sealing tests - Test 14d. Immersion. Waterproof

BS IEC 62629-12-1:2014

3D Display devices - Measuring methods for stereoscopic displays using glasses. Optical

BS EN 60512-1-3:1997

Connectors for electronic equipment. Tests and measurements. General - Test 1c. Electrical engagement length

ASTM D5138 : 23

Standard Classification System and Basis for Specification for Liquid Crystal Polymers Molding and Extrusion Materials (LCP)

ASTM F1364 : 03(2022)

Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System

ASTM E431 : 96(2022)

Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

ASTM F3095 : 17a(2022)

Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System

ASTM B1004 : 16(2022)

Standard Practice for Contact Performance Classification of Electrical Connection Systems

ASTM D3380 : 22

Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates

ASTM E1161 : 21

Standard Practice for Radiographic Examination of Semiconductors and Electronic Components

ASTM F3080 : 21

Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector, Infrared Measurement, and CCTV Camera System

ASTM B885 : 09(2020)

Standard Test Method for Presence of Foreign Matter on Printed Wiring Board Contacts

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

ASTM E1250 : 15(2020)

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

ASTM E1855 : 20

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

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